A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis
نویسندگان
چکیده
The requirements of a highly tilted sample and a well-polished surface for optimal EBSD pattern collection can make traditional SEM imaging challenging. With a tilted sample, SEM SE and BSE detectors are often in non-optimal positions for electron detection. For many materials, the polished surfaces produce weak contrast with SE imaging. Traditionally placed BSE detectors must be used with care, as a highly tilted sample can risk collision as the sample size and region of interest increases.
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